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High diagnostic yield of syndromic intellectual disability by targeted next-generation sequencing

Authors

  1. Correspondence to Dr Francisco Martínez, PhD, Unidad de Genetica, Hospital Universitario y Politecnico La Fe, Valencia 46026, Spain; francisco{at}gva.es
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Citation

Martínez F, Caro-Llopis A, Roselló M, et al
High diagnostic yield of syndromic intellectual disability by targeted next-generation sequencing

Publication history

  • Received April 16, 2016
  • Revised June 15, 2016
  • Accepted August 20, 2016
  • First published September 12, 2016.
Online issue publication 
January 20, 2017

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